Product Details | SEMICONDUCTOR DEVICE TEST SET

6625-01-451-1404 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.

Part Alternates: PROTRACK I MODEL 10, PROTRACKIMODEL10, 6625-01-451-1404, 01-451-1404, 6625014511404, 014511404

Instruments and Laboratory Equipment | Electrical and Electronic Properties Measuring and Testing Instruments

Supply Group (FSG) NSN Assign. NIIN
66 05 DEC 1997 01-451-1404

Cross Reference | NSN 6625-01-451-1404

Part Number Cage Code Manufacturer
PROTRACK I MODEL 10 57705 HUNTRON INC DBA HUNTRON INSTRUMENTS

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Technical Data | NSN 6625-01-451-1404

Characteristic Specifications
INCLOSURE FEATURE SINGLE ITEM W/HOUSING

Restrictions/Controls & Freight Information | NSN 6625-01-451-1404

Category Code Description
Hazardous Material Indicator CodePThere is no information in the HMIS; however, the NSN is in an FSC in Table II of Federal Standard 313 and an MSDS may be required by the user. The requirement for an MSDS is dependent on a hazard determination of the supplier or the intended end use of the product
Demilitarization Code:ANon-Munitions List Item/ Non-Strategic List Item - Demilitarization not required.
Electro-static Discharge Susceptible:ANo known Electrostatic Discharge (ESD) or Electromagnetic Interference (EMI) sensitivity
Precious Metals Indicator Code:AItem does not contain precious metal
Criticality Code:X The item does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application.
Automatic Data Processing Equipment:0Represents items with no ADP components. NOTE: Codes 1 through 6 are only to be used when the item is Automatic Data Processing Equipment (ADPE) in its entirety and is limited to the type meeting only one of the definitions for codes 1 through 6. (See code 9)
Category Code Description
No Freight Information