Product Details | SEMICONDUCTOR DEVICE TEST SET

6625-01-182-9497 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.

Part Alternates: RTF475FWB, 6625-01-182-9497, 01-182-9497, 6625011829497, 011829497

Instruments and Laboratory Equipment | Electrical and Electronic Properties Measuring and Testing Instruments

Supply Group (FSG) NSN Assign. NIIN
66 01-182-9497

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Restrictions/Controls & Freight Information | NSN 6625-01-182-9497

Category Code Description
Hazardous Material Indicator CodePThere is no information in the HMIS; however, the NSN is in an FSC in Table II of Federal Standard 313 and an MSDS may be required by the user. The requirement for an MSDS is dependent on a hazard determination of the supplier or the intended end use of the product
Category Code Description
No Freight Information