NSN 6625-00-808-1800 175, 00-808-1800, 008081800
Product Details | SEMICONDUCTOR DEVICE TEST SET
6625-00-808-1800 A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both.
Part Alternates: 175, 6625-00-808-1800, 00-808-1800, 6625008081800, 008081800
Instruments and Laboratory Equipment | Electrical and Electronic Properties Measuring and Testing Instruments
| Supply Group (FSG) | NSN Assign. | NIIN | Item Name Code (INC) |
|---|---|---|---|
| 66 | 00-808-1800 | 25006 ( TEST SET, SEMICONDUCTOR DEVICE ) |
Demand History | NSN 6625-00-808-1800
| Part Number | Request Date | QTY | Origin |
|---|---|---|---|
| 175 | 2015-11-20 | 2000 |
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Related Products | NSN 6625-00-808-1800
Restrictions/Controls & Freight Information | NSN 6625-00-808-1800
| Category | Code | Description |
|---|---|---|
| Hazardous Material Indicator Code | P | There is no information in the HMIS; however, the NSN is in an FSC in Table II of Federal Standard 313 and an MSDS may be required by the user. The requirement for an MSDS is dependent on a hazard determination of the supplier or the intended end use of the product |
| Category | Code | Description |
|---|---|---|
| No Freight Information | ||